Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F02%3APU36182" target="_blank" >RIV/00216305:26230/02:PU36182 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm
Original language description
The paper deals with the problem of selecting registers into a scan chain, the problem is solved on RT level. As a result of the methodology, it is not only stated which registers shall be modified into scan registers but also how registers will be organized into sections, namely how registers will be subdivided and ordered in sections. The partial scan problem is defined and seen as a combinatorial problem, a mathematical formula is used to demonstrate it. The problem of selecting registers for scan chhain is solved through genetic algorithm. The methodology was implemented and verified on DIFFEQ benchmark circuit. Experimental results are compared with results gained in other approaches.
Czech name
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Czech description
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Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop
ISBN
80-214-2094-4
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
44-51
Publisher name
Brno University of Technology
Place of publication
Brno
Event location
Brno
Event date
Apr 17, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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