Retargetable Multi-level Debugging in HW/SW Codesign
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F11%3APU96012" target="_blank" >RIV/00216305:26230/11:PU96012 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Retargetable Multi-level Debugging in HW/SW Codesign
Original language description
Debugging is a standard part of an embedded system design process. The debugger is used for a target application debugging and for a testing of the designed system. The target application debugging can be performed either on a statement-accurate level (i.e. source-language level debugging) or on an instruction-accurate level (i.e. assembly-language level debugging). The architecture design debugging is done on a cycle-accurate level. Nowadays embedded systems are often parallel-based. Therefore, it is important to allow debugging of systems with more than one application-specific instruction set processors (ASIP). Since the current trend of ASIP design is focused on automatic tool-chain generation, the debugger must be retargetable to arbitrary architecture. In this paper, we present the concept of an automatically generated multi-level retargetable debugger. This debugger can operate on each of the previously mentioned levels and it allows debugging of multiprocessor systems. The expe
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
The 23rd International Conference on Microelectronics (ICM 2011)
ISBN
978-1-4577-2209-7
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
1-6
Publisher name
Institute of Electrical and Electronics Engineers
Place of publication
Hammamet
Event location
Hammamet
Event date
Dec 19, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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