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Fault Tolerant System Design and SEU Injection based Testing

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F12%3APU98179" target="_blank" >RIV/00216305:26230/12:PU98179 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.fit.vutbr.cz/research/pubs/all.php?id=9902" target="_blank" >http://www.fit.vutbr.cz/research/pubs/all.php?id=9902</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Fault Tolerant System Design and SEU Injection based Testing

  • Original language description

    The methodology for design and testing of fault tolerant systems implemented into an FPGA platform with different types of diagnostic techniques is presented in this paper. Basic principles of partial dynamic reconfiguration are described together with their impact on the fault tolerance features of the digital design implemented into SRAM-based FPGA. The methodology includes detection and localization of a faulty module in the system and its repair and bringing the system back to the state in which it operates correctly. The automatic repair process of a faulty module is implemented by a partial dynamic reconfiguration driven by a generic controller inside FPGA. The presented methodology was verified on the ML506 development board with Virtex5 FPGA for different types of RTL components. Fault tolerant systems developed by the presented methodology were tested by means of the newly developed SEU simulation framework. The framework is based on the SEU simulation through the JTAG interface and allows us to select the region of the FPGA where the SEU is placed. The simulator does not require any changes in the tested design and is fully independent of the functions in the FPGA. The external SEU generator into FPGA is implemented and its function is verified on an evaluation board ML506 for several types of fault tolerant architectures. The experimental results show the fault coverage and SEU occurrence causing faulty behavior of verified architectures.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>ost</sub> - Miscellaneous article in a specialist periodical

  • CEP classification

  • OECD FORD branch

    10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microprocessors and Microsystems

  • ISSN

    0141-9331

  • e-ISSN

    1872-9436

  • Volume of the periodical

    2013

  • Issue of the periodical within the volume

    37

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    18

  • Pages from-to

    155-173

  • UT code for WoS article

  • EID of the result in the Scopus database