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Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F13%3APU106327" target="_blank" >RIV/00216305:26230/13:PU106327 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

  • Original language description

    As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches devoted to verification of hardened systems, with respect to the test set generation: the first one is based on classical Automatic Test Pattern Generation, the second one on Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced few ideas about their combination in order to create a new promising approach for verification of reliable systems.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems

  • ISBN

    978-1-4673-6133-0

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    275-278

  • Publisher name

    IEEE Computer Society

  • Place of publication

    Karlovy Vary

  • Event location

    Karlovy Vary

  • Event date

    Apr 8, 2013

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article