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Thickness measurement of thin soft organic films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26310%2F12%3APU103402" target="_blank" >RIV/00216305:26310/12:PU103402 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Thickness measurement of thin soft organic films

  • Original language description

    This paper compares chromatic white light (CWL) and interference microscope measurements aiming to find a proper non-contact method for a thickness determination of thin soft organic films. Standard samples with vacuum deposited aluminum films of different thicknesses in the range of 50-1000 nm were prepared and measured by both methods. It was found that the CWL technique is proper for a measurement of thin soft organic films with higher than 40-50 nm film thicknesses. As a complementary feature of themethod 2D and 3D surface morphology imaging of the films could be recorded and the surface film roughness could be calculated. In a case of optical inhomogeneity the method requires covering with a uniform high reflective coating. The interference microscopy method results in a relatively lower film thickness with a higher standard deviation and a higher standard relative error. It could be connected with the resolution of the interferograms measured.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    CF - Physical chemistry and theoretical chemistry

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED0012%2F01%2F01" target="_blank" >ED0012/01/01: Centres for materials research at FCH BUT</a><br>

  • Continuities

    O - Projekt operacniho programu

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Electronics Technology (ISSE), 2012 35th International Spring Seminar on

  • ISBN

    978-1-4673-2241-6

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    367-372

  • Publisher name

    Neuveden

  • Place of publication

    Bad Aussee, Austria

  • Event location

    Bad Aussee

  • Event date

    May 9, 2012

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article