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LITESCOPE (TM) AFM-IN-SEM: ADVANCED TOOL FOR CORRELATIVE IMAGING AND SURFACE CHARACTERIZATION

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F19%3APU147226" target="_blank" >RIV/00216305:26620/19:PU147226 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.37904/nanocon.2019.8655" target="_blank" >http://dx.doi.org/10.37904/nanocon.2019.8655</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.37904/nanocon.2019.8655" target="_blank" >10.37904/nanocon.2019.8655</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    LITESCOPE (TM) AFM-IN-SEM: ADVANCED TOOL FOR CORRELATIVE IMAGING AND SURFACE CHARACTERIZATION

  • Original language description

    Atomic force microscope (AFM) LiteScope (TM) produced by NenoVision is carefully designed for direct integration into many different types of scanning electron microscopes (SEM). It is equipped with unique technology for true correlative imaging - Correlative Probe and Electron Microscopy (TM) (CPEM). It allows simultaneous measurement of various signals of SEM, AFM and other related techniques like Electron Beam Induced Current (EBIC) or Catodoluminiscence (CL). LiteScope also enables using other methods such as Focused Ion Beam (FIB), Gas Injection System (GIS) or Electron Dispersive X-ray (EDX) to modify and right away analyze the sample surface. Among the main applications belong e.g. 3D surface characterization, height/depth profiling, surface roughness calculation, precise tip navigation, nanoindentation and nanomanipulation, variety of spectroscopic regimes, measurement of electrical and mechanical sample properties, etc.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    21001 - Nano-materials (production and properties)

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    11TH INTERNATIONAL CONFERENCE ON NANOMATERIALS - RESEARCH & APPLICATION (NANOCON 2019)

  • ISBN

    978-80-87294-95-6

  • ISSN

    2694-930X

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    568-572

  • Publisher name

    TANGER LTD

  • Place of publication

    SLEZSKA

  • Event location

    Brno

  • Event date

    Oct 16, 2019

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article

    000664115400097