High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F21%3APU138250" target="_blank" >RIV/00216305:26620/21:PU138250 - isvavai.cz</a>

Result on the web

<a href="https://iopscience.iop.org/article/10.1088/1361-6463/abc77d" target="_blank" >https://iopscience.iop.org/article/10.1088/1361-6463/abc77d</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1361-6463/abc77d" target="_blank" >10.1088/1361-6463/abc77d</a>

Result language

angličtina

Original language name

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

Original language description

We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowire has been measured and compared to micromagnetic modeling. State-of-the-art off-axis electron holography has been performed using the averaging of large series of holograms to improve the sensitivity of the measurements. These results are then compared to those obtained from pixelated differential phase contrast, a technique that belongs to pixelated (or 4D) scanning transmission electron microscopy (STEM) experiments. This emerging technique uses a pixelated detector to image the local diffraction patterns as the beam is scanned over the sample. For each diffraction pattern, the deflection of the beam is measured and converted into magnetic induction, while scanning the beam allows a map to be generated. Aberration corrected Lorentz (field-free) configurations of the TEM and STEM were used for an improved spatial resolution. We show that the pixelated STEM approach, even when performed using an old generation of charge-coupled device camera, provides better sensitivity at the expense of spatial resolution. A more general comparison of the two quantitative techniques is given.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

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Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2021

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Physics D - Applied Physics

ISSN

0022-3727

e-ISSN

1361-6463

Volume of the periodical

54

Issue of the periodical within the volume

8

Country of publishing house

GB - UNITED KINGDOM

Number of pages

11

Pages from-to

1-11

UT code for WoS article

000599105900001

EID of the result in the Scopus database

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