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Simulation of the Electrical Properties of a Graphene Monolayer Field Effect Transistor

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU155971" target="_blank" >RIV/00216305:26620/24:PU155971 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/10652423" target="_blank" >https://ieeexplore.ieee.org/document/10652423</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/IVNC63480.2024.10652423" target="_blank" >10.1109/IVNC63480.2024.10652423</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Simulation of the Electrical Properties of a Graphene Monolayer Field Effect Transistor

  • Original language description

    Field-effect graphene transistors are finding increasing commercial and research applications. Simulation is an important step in facilitating this transition. It contributes to understanding the work process, identifying potential issues and minimizing the cost of production. In this work, the electrical characteristics of back-gated graphene field-effect transistor were simulated using ANSYS electronics software. The output current was studied by applying a voltage difference between the source and drain ranging from -5 mV to 5 mV. The back-gate applied voltage was -50 to 50 V. The results show that the gate voltage induced a similar change in both the contact and channel resistance but did not change the density of mobility of positive and negative carriers

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    21000 - Nano-technology

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    International Vacuum Nanoelectronics Conference

  • ISBN

    979-8-3503-7977-8

  • ISSN

    2164-2370

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    „“-„“

  • Publisher name

    IEEE

  • Place of publication

    NEW YORK

  • Event location

    Brno

  • Event date

    Jul 15, 2024

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    001310530600040