Kelvin Probe Force Microscopy (KPFM)

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000008" target="_blank" >RIV/04525671:_____/23:N0000008 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Kelvin Probe Force Microscopy (KPFM)
Original language description
An application note is a document detailing the use of a technique or application of an instrument. In the case of Kelvin Probe Force Microscopy (KPFM), it is a method of estimating the local distribution of surface potentials. KPFM uses lock-in amplifiers and measures the topography of the sample in contact mode in the first pass. Then the tip is lifted and repeats its trajectory in a second pass, where the electrical interaction between the tip and the sample is recorded without the influence of the topography. As an example application, a biodegradable alloy for advanced prosthetics is shown. The improvement of the mechanical properties of such materials is performed by accurately estimating the contact potential of the sample surface using KPFM. The surface of the sample has been modified by the focused ion beam technique, and with KPFM, true precipitates can be clearly distinguished from other surface irregularities.
Czech name
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Czech description
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Project
<a href="/en/project/FV40238" target="_blank" >FV40238: Advanced microsocpy techniques</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2023
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

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