Conductive Atomic Force Microscopy (C-AFM)

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000009" target="_blank" >RIV/04525671:_____/23:N0000009 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Conductive Atomic Force Microscopy (C-AFM)
Original language description
An application note is a document detailing the use of a technique or application of an instrument. In the case of conductive atomic force microscopy (C-AFM), it is a technique that provides a high-resolution map of the local conductivity of a sample. In this technique, a voltage is applied between the tip and the sample and the current flowing through the contact between the tip and the sample is recorded. The resulting image shows the conductivity of the path from the tip to the ground on the opposite side of the sample. The application note also gives an example of the use of C-AFM for the study of lithium-ion battery materials and highlights the advantages of this technique in assessing the homogeneity of the coating on the surface of the sample grains, which is not visible in conventional SEM or AFM.
Czech name
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Czech description
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Project
<a href="/en/project/FV40238" target="_blank" >FV40238: Advanced microsocpy techniques</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2023
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

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