Piezoresponse Force Microscopy (PFM)
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000016" target="_blank" >RIV/04525671:_____/23:N0000016 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Piezoresponse Force Microscopy (PFM)
Original language description
An application note is a document detailing the use of a technique or application of an instrument. The application note for the Piezoresponse Force Microscopy (PFM) technique describes its principle, which is to map the domain structure of piezoelectric materials on the sample surface. The method uses a lock-in amplifier to demodulate the oscillations of the sample surface caused by AC voltage. As an application example, a study of the use of a new material, Aluminum Scandium Nitride (AlScN), for the fabrication of high-frequency RF filters in mobile devices is presented. An application note provides information on the principle and potential applications of PFM in the analysis of piezoelectric materials.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
21000 - Nano-technology
Result continuities
Project
<a href="/en/project/FV40238" target="_blank" >FV40238: Advanced microsocpy techniques</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2023
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.