All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

U.S. Patent 9,099,481: Methods of laser marking semiconductor substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F26821532%3A_____%2F15%3A%230000089" target="_blank" >RIV/26821532:_____/15:#0000089 - isvavai.cz</a>

  • Result on the web

    <a href="http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=9,099,481.PN.&OS=PN/9,099,481&RS=PN/9,099,481" target="_blank" >http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=9,099,481.PN.&OS=PN/9,099,481&RS=PN/9,099,481</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    U.S. Patent 9,099,481: Methods of laser marking semiconductor substrates

  • Original language description

    The present application relates, in general, to electronics, and more particularly, to semiconductors, structures thereof, and methods of forming semiconductor devices. In the past, the semiconductor industry has utilized various methods to form semiconductor devices. Semiconductor wafers can be used as the substrates for production of semiconductor devices. A substrate wafer can be made of a bulk semiconductor material such as silicon or a bulk material with a top layer, for example deposited using a homo- or hetero-epitaxial deposition process, or a wafer bonding process. Semiconductor substrates can be processed in highly-automated wafer fabs that use identification of each wafer. Also, engineering tests may have required additional identification of the processed wafers. Such identification can be provided with laser scribing on the wafer. A laser beam can be used to locally melt the material and thereby a visible "spot" was produced. From such spots symbols can be created. In some

  • Czech name

  • Czech description

Classification

  • Type

    P - Patent

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/TA01010078" target="_blank" >TA01010078: SOI Structures for Advanced Semiconductor Applications</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Patent/design ID

    US001 9,099,481

  • Publisher

    US001 -

  • Publisher name

    United States Patent and Trademark Office (USPTO)

  • Place of publication

    Alexandria

  • Publication country

    US - UNITED STATES

  • Date of acceptance

    Apr 4, 2015

  • Owner name

    SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

  • Method of use

    A - Výsledek využívá pouze poskytovatel

  • Usage type

    A - K využití výsledku jiným subjektem je vždy nutné nabytí licence