Efficient Tas Pattern Compression Method Using Hard Fault Preferring

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F08%3A%230001333" target="_blank" >RIV/46747885:24220/08:#0001333 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Efficient Tas Pattern Compression Method Using Hard Fault Preferring
Original language description
This paper describes new compression method that is used for test pattern compaction and compression in algorithm called COMPAS, which utilizes a test data compression method based on pattern overlapping. This algorithm reorders and compresses deterministic test patterns previously generated in an ATPG by overlapping them. Independency of COMPAS on used ATPG is discussed and verified. New method improves compression ratio by preprocessing input data to determine the degree of random test resistance foreach fault. This information allows the algorithm to reorder test patterns more efficiently and results to 10% compression ratio improvement in average. Compressed data sequence is well suited for decompression by the scan chains in the embedded tester cores.
Czech name
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Czech description
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Project
<a href="/en/project/1QS108040510" target="_blank" >1QS108040510: Technology for improving the testability of modern digital circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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