Test Pattern Compression Based on Pattern Overlapping
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F07%3A03133237" target="_blank" >RIV/68407700:21230/07:03133237 - isvavai.cz</a>
Alternative codes found
RIV/46747885:24220/07:#0000389
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Test Pattern Compression Based on Pattern Overlapping
Original language description
The paper describes a test data compression method based on pattern overlapping. It refers about new improvements of the COMPAS algorithm that uses test pattern overlapping.
Czech name
Test Pattern Compression Based on Pattern Overlapping
Czech description
Článek popisuje vylepšenou verzi vlastní metody komprese testovacích vzorků, založenou na překrývání testovacích vektorů. jsou popsány metody vylepšující algoritmus COMPAS, který využívá uvedenou metodiku komprese vektorů.
Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/1QS108040510" target="_blank" >1QS108040510: Technology for improving the testability of modern digital circuits</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Design and Diagnostics of Electronic Circuits and Systems
ISBN
1-4244-1161-0
ISSN
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e-ISSN
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Number of pages
66
Pages from-to
29-34
Publisher name
IEEE Computer Society
Place of publication
Los Alamitos
Event location
Krakow
Event date
Apr 10, 2007
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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