On Test Compression Based on Pattern Overlapping and Broadcasting

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00182783" target="_blank" >RIV/68407700:21240/11:00182783 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
On Test Compression Based on Pattern Overlapping and Broadcasting
Original language description
The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique.This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction. It will conclude by giving a number of ideas for continuation of work in this field.
Czech name
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Czech description
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Project
<a href="/en/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: SoC circuits reliability and availability improvement</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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