Test Pattern Compression Based on Pattern Overlapping and Broadcasting
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00184355" target="_blank" >RIV/68407700:21240/11:00184355 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5952372&isnumber=5952357" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5952372&isnumber=5952357</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/IWECMS.2011.5952372" target="_blank" >10.1109/IWECMS.2011.5952372</a>
Alternative languages
Result language
angličtina
Original language name
Test Pattern Compression Based on Pattern Overlapping and Broadcasting
Original language description
The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: SoC circuits reliability and availability improvement</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2011 10th International workshop on Electronics, Control, Measurement and Signals (ECMS)
ISBN
978-1-61284-397-1
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
1-5
Publisher name
IEEE Computer Society Press
Place of publication
New York
Event location
Liberec
Event date
Jun 1, 2011
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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