On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F13%3A%230002859" target="_blank" >RIV/46747885:24220/13:#0002859 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6645584&isnumber=6645482" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6645584&isnumber=6645482</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/FPL.2013.6645584" target="_blank" >10.1109/FPL.2013.6645584</a>

Result language
angličtina
Original language name
On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.
Original language description
This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach anda very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overviewof such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-en
Czech name
—
Czech description
—

Project
<a href="/en/project/LD13019" target="_blank" >LD13019: Improvement in Reliability of Nano-scale circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
In:23rd International Conference on Field Programmable Logic and Applications (FPL'13)
ISBN
978-1-4799-0004-6
ISSN
—
e-ISSN
—
Number of pages
4
Pages from-to
—
Publisher name
IEEE
Place of publication
Porto, Portugal
Event location
Porto, Portugal
Event date
Jan 1, 2013
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—

Similar results(10)