Measuring and Identifying Aging-Critical Paths in FPGAs
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F15%3A%230003446" target="_blank" >RIV/46747885:24220/15:#0003446 - isvavai.cz</a>
Result on the web
<a href="http://www.median-project.eu/events/median2015" target="_blank" >http://www.median-project.eu/events/median2015</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.13140/RG.2.1.3147.4729" target="_blank" >10.13140/RG.2.1.3147.4729</a>
Alternative languages
Result language
angličtina
Original language name
Measuring and Identifying Aging-Critical Paths in FPGAs
Original language description
Rapidly growing portfolio of new technologies in design and manufacturing of advanced integrated circuits enabled higher integration of complex structures at ultra-high nano-scale densities and using very deep sub-micron technologies. However, the new devices and circuits are sensitive to negative effects of various changes of the internal nanostructures and their parameters, including aging effects. This time-dependent variation, caused nowadays mainly by NBTI (Negative Bias Temperature Instability), may result in signal propagation slow down along the paths between flip-flops and causing functional failures in the circuit. In this paper we propose an approach to identify and also to measure aging-critical paths on real integrated circuit?s systems innanoscale programmable logic such as FPGAs (Field Programmable Gate Arrays). The approach is based on hierarchical modelling of dynamic NBTI aging related parameters of the basic structural elements in programmable logic. The case study
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LD13019" target="_blank" >LD13019: Improvement in Reliability of Nano-scale circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů