Advanced measurements and reliability assessments in modern nanoscale FPGAs

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F15%3A%230003450" target="_blank" >RIV/46747885:24220/15:#0003450 - isvavai.cz</a>
Result on the web
<a href="http://iktdk.dcc.ttu.ee/data/iktdk_conf_call_2014.pdf" target="_blank" >http://iktdk.dcc.ttu.ee/data/iktdk_conf_call_2014.pdf</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Advanced measurements and reliability assessments in modern nanoscale FPGAs
Original language description
Rapidly growing portfolio of new technologies in design and manufacturing of advanced integrated circuits allow higher integration of complex structures in ultra-high nano-scale densities. The speed of development and implementation of innovative technologies is amazing. FPGA (Field Programmable Gate Array) devices allow designing logic circuits directly in software. FPGAs consist of sets of high number of after-manufacturing custom configurable programmable circuits and memory block elements and units.In addition, new FPGA families are introduced very soon or just together with the new technologies used in ASIC (Application Specific Integrated Circuits). Today?s technologies get closer and closer to the physical limits and the nature of physics. It also is one of the main reasons why the new devices are sensitive to negative effects of various changes of the internal nanostructures and parameters. Voltage scaling does not keep pace with physical scaling and poses serious reliability
Czech name
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Czech description
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Project
<a href="/en/project/LD13019" target="_blank" >LD13019: Improvement in Reliability of Nano-scale circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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