Investigating diachrony of programmable microelectronic nanostructures

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F13%3A%230002861" target="_blank" >RIV/46747885:24220/13:#0002861 - isvavai.cz</a>
Result on the web
<a href="http://www.scopus.com/record/display.url?origin=AuthorProfile&view=basic&eid=2-s2.0-84891517542" target="_blank" >http://www.scopus.com/record/display.url?origin=AuthorProfile&view=basic&eid=2-s2.0-84891517542</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ECMSM.2013.6648931" target="_blank" >10.1109/ECMSM.2013.6648931</a>

Result language
angličtina
Original language name
Investigating diachrony of programmable microelectronic nanostructures
Original language description
New technologies of design and manufacturing of advanced integrated circuits allow higher integration of complex structures in ultra-high nano-scale densities. The rapidly growing world of FPGA devices creates important platform for analyses of process scaling and new study opportunities in case of new process variations and degradation effects. However the real devices are not the ideal ones and they are subjects of aging of the internal nanostructures. Changes in parameters of FPGAs in time, or undereither power supply voltage or temperature variations, can result in significant delays and may affect the final design quality and dependability. Such timing variations may result in delay faults, up to the final device or equipment malfunction or failure. Especially the world of ASIC devices is comprehensively investigated again and again with the new processes coming every (approximately) 2 years. This paper presents an unusual solution of the aging measurement, analysis and test unit
Czech name
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Czech description
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Project
<a href="/en/project/LD13019" target="_blank" >LD13019: Improvement in Reliability of Nano-scale circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
11th IEEE International Workshop on Electronics, Control, Measurement, Signals and Their Application to Mechatronics, ECMSM 2013
ISBN
9781467362979
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
IEEE Computer Society
Place of publication
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Event location
Toulouse; France
Event date
Jan 1, 2013
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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