Sequential Test Decompressors with Fast Variable Wide Spreading
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F16%3A00000295" target="_blank" >RIV/46747885:24220/16:00000295 - isvavai.cz</a>
Result on the web
<a href="http://ddecs2016.fiit.stuba.sk/DDECS_2016/" target="_blank" >http://ddecs2016.fiit.stuba.sk/DDECS_2016/</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DDECS.2016.7482454" target="_blank" >10.1109/DDECS.2016.7482454</a>
Alternative languages
Result language
angličtina
Original language name
Sequential Test Decompressors with Fast Variable Wide Spreading
Original language description
Usually, test pattern decompressors with dynamic reseeding are reset before starting a new test pattern decoding. The first few scan chain slices are then filled with test vectors that have lower decodability as the number of free variables is limited by the test access mechanism bandwidth. We have found that it is possible to increase the number of free variables in the equations describing the care bits encoding by fast creating and wide spreading as many as possible independent linear combinations of the tester bits and using them for the scan chain loading. We propose a decompressor combining a combinational linear decompressor and an LFSR like automaton that effectively distributes the free variables within the test pattern. The proposed test pattern decompressor outperforms the decodability of other decompressors with similar hardware overhead and it reduces the test time due to a possible reduction of the decompressor preloading.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
—
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
978-1-5090-2816-0
ISSN
—
e-ISSN
—
Number of pages
6
Pages from-to
132-137
Publisher name
IEEE
Place of publication
Košice, Slovakia
Event location
Košice, Slovakia
Event date
Jan 1, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—