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Sequential Test Decompressors with Fast Tester Bits Wide-Spreading

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F17%3A00004250" target="_blank" >RIV/46747885:24220/17:00004250 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.worldscientific.com/doi/pdf/10.1142/S0218126617400011" target="_blank" >http://www.worldscientific.com/doi/pdf/10.1142/S0218126617400011</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1142/S0218126617400011" target="_blank" >10.1142/S0218126617400011</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Sequential Test Decompressors with Fast Tester Bits Wide-Spreading

  • Original language description

    Usually, test pattern decompressors with dynamic reseeding are reset before starting a new test pattern decoding. The first few scan chain slices are then filled with test vectors that have lower decoding ability as the number of free variables is limited by the test access mechanism bandwidth. We have found that even within this limitation, it is possible to improve the decodability by creating fast and wide-spreading as many as possible independent linear combinations of the tester bits and using them for the scan chain loading. We evaluated features influencing the decompression quality and the hardware overhead for different decompressor principles. According to the evaluation results, we proposed a decompressor combining a XOR network and a linear feedback shift register (LFSR)-like automaton; we place the XOR network on the LFSR inputs. We demonstrate that due to this arrangement, the combined decompressor can be used without any phase shifter or state skipping ability of the LFSR. We have experimentally verified that adopting the proposed decompressor structure improves test coverage, saves the hardware resources and shortens the test application time.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20206 - Computer hardware and architecture

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS

  • ISSN

    0218-1266

  • e-ISSN

  • Volume of the periodical

    26

  • Issue of the periodical within the volume

    8

  • Country of publishing house

    SG - SINGAPORE

  • Number of pages

    16

  • Pages from-to

  • UT code for WoS article

    000399226200002

  • EID of the result in the Scopus database

    2-s2.0-85011536753