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Failure Modes of Solder Interconnections under Mechanical Shock Loading at Elevated Temperaturs

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F06%3A00000281" target="_blank" >RIV/49777513:23220/06:00000281 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Failure Modes of Solder Interconnections under Mechanical Shock Loading at Elevated Temperaturs

  • Original language description

    Portable equipment are primarily exposed to local temperature fluctuations by internally generated heat dissipation as well as to mechanical shock loadings due to accidental droppings. The reliability of test boards was studied under mechanical shock loadings at elevated temperatures. Component boards were loaded by using a high amplitude (high-frequency) vibration tester because very similar loading conditions can be produced with the vibration tester as compared to the JESD22-B111 type drop tester with much less time and effort. The same experimental design was repeated with the JESD22-B111 drop tested to conform that the failure modes and mechanism are equal. The leadfree materials used in the reliability tests were chosen to represent those typically used in portable electronic products.

  • Czech name

    Failure Modes of Solder Interconnections under Mechanical Shock Loading at Elevated Temperaturs

  • Czech description

    Tento člának se zabývá rázovými zkouškami pájeného spoje při zvýšených teplotách.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2006

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    ESTC 2006

  • ISBN

    1-4244-0552-1

  • ISSN

  • e-ISSN

  • Number of pages

    8

  • Pages from-to

    195-202

  • Publisher name

    IEEE

  • Place of publication

    Dresden

  • Event location

    Drážďany

  • Event date

    Jan 1, 2006

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article