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A comparison of the shear strength of conductive adhesives and soldering alloys

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F15%3A43925340" target="_blank" >RIV/49777513:23220/15:43925340 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7247983&newsearch=true&queryText=A%20comparison%20of%20the%20shear%20strength%20of%20conductive%20adhesives%20and%20soldering%20alloys" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7247983&newsearch=true&queryText=A%20comparison%20of%20the%20shear%20strength%20of%20conductive%20adhesives%20and%20soldering%20alloys</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2015.7247983" target="_blank" >10.1109/ISSE.2015.7247983</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    A comparison of the shear strength of conductive adhesives and soldering alloys

  • Original language description

    This paper describes the influence of the cure schedule on the shear strength of the joint glued by EPO-TEK(R) H20S and 8331S. This work also describes the influence of solder alloy types on the shear strength of the solder joint. Joints were made by soldering and gluing of chip resistors 1206, 0805 and 0603 with different temperature profiles on rigid and flexible substrates. For soldering profiles were calculated heating factors. These profiles have an effect on the mechanical strength of the joint. Samples are measured after curing/soldering process by using shear strength test.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED2.1.00%2F03.0094" target="_blank" >ED2.1.00/03.0094: Regional Innovation Centre for Electrical Engineering (RICE)</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 2015 38th International Spring Seminar on Electronics Technology (ISSE 2015)

  • ISBN

    978-1-4799-8860-0

  • ISSN

    2161-2528

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    1-6

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Eger, Maďarsko

  • Event date

    May 6, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article