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Influence of electrically conductive adhesive quantity on insulation distance and shear strength of glued joints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F16%3A43928892" target="_blank" >RIV/49777513:23220/16:43928892 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/7563175/" target="_blank" >http://ieeexplore.ieee.org/document/7563175/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2016.7563175" target="_blank" >10.1109/ISSE.2016.7563175</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Influence of electrically conductive adhesive quantity on insulation distance and shear strength of glued joints

  • Original language description

    This article deals with the impact of electrically conductive adhesive quantity on the insulation distance and shear strength of joints glued by adhesives "MG 8331S" and Hysol CA3150" on rigid substrates FR-4. These joints were formed by adhesive bonding of chip resistors 0805. Nine different shapes of apertures in stencil were used for this experiment. These differences have an effect on the quantity of conductive adhesives which is used on the samples and an effect on the insulation distance between pads. Samples were measured after the curing process by using a shear strength test applied by the device LabTest 3.030. This article presents the effects of different shapes apertures in stencil and different quantities of adhesives on the mechanical strength of the joint and the insulation distance between pads.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/LO1607" target="_blank" >LO1607: RICE - New technologies and concepts for smart industrial system</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the International Spring Seminar of Electronics Technology (ISSE 2016)

  • ISBN

    978-1-5090-1389-0

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    134-139

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Pilsen, Czech Republic

  • Event date

    May 18, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000387089800026