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Optimization of apertures shapes in stencil for ECA printing to connecting of SMD components on PCBs

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F19%3A43958055" target="_blank" >RIV/49777513:23220/19:43958055 - isvavai.cz</a>

  • Result on the web

    <a href="http://147.228.94.30/images/PDF/Rocnik2019/Cislo2_2019/r13c2c4.pdf" target="_blank" >http://147.228.94.30/images/PDF/Rocnik2019/Cislo2_2019/r13c2c4.pdf</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optimization of apertures shapes in stencil for ECA printing to connecting of SMD components on PCBs

  • Original language description

    This paper deals with the influence of different apertures shape in stencil on mechanical shear strength, electrical resistance and insulation distance. In the experiment, the SMD chip components 0805 were assembled on flexible substrate by electrically conductive adhesives (MG 8331S, CA 3150). Six different shapes of apertures in stencil were used for this experiment. These differences have an effect on the quantity of conductive adhesives which is used on the samples and an effect on the insulation distance between pads. The half of samples was measured directly (electrical resistance, mechanical strength and insulation distance) and second half of samples was submitted to the accelerated ageing test (85°C/85%RH/16hrs) and then tested the same way. The results shows that it is appropriate to choose other aperture shape in stencil than standard rectangular shape.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>ost</sub> - Miscellaneous article in a specialist periodical

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/EF18_069%2F0009855" target="_blank" >EF18_069/0009855: Electrical Engineering Technologies with High-Level of Embedded Intelligence</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Electroscope

  • ISSN

    1802-4564

  • e-ISSN

  • Volume of the periodical

    2019

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    6

  • Pages from-to

    1-6

  • UT code for WoS article

  • EID of the result in the Scopus database