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Bending endurance of printed conductive patterns on flexible substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F16%3A43928896" target="_blank" >RIV/49777513:23220/16:43928896 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/7563185/" target="_blank" >http://ieeexplore.ieee.org/document/7563185/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2016.7563185" target="_blank" >10.1109/ISSE.2016.7563185</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Bending endurance of printed conductive patterns on flexible substrates

  • Original language description

    This paper presents a research focused on the testing of flexible and printed components' mechanical properties. The flexibility and the bending endurance are the crucial properties for the production of smart labels and tags for smart packages. For these reasons, the presented research was concentrated on the development of bend test apparatus, as well as, on the specification and optimization of testing procedures. These procedures were verified on specially designed conductive test patterns manufactured by the use of three different technologies - standard flexible PCB manufacturing, screen printing of Ag pastes and Aerosol Jet(R) printing of Ag ink. Electrical parameters of test patterns were measured online and offline during the testing. The influences of test samples' electrical resistance on the number of bend cycles for different bending radiuses are described in this paper.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the International Spring Seminar of Electronics Technology (ISSE 2016)

  • ISBN

    978-1-5090-1389-0

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    184-188

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Pilsen, Czech Republic

  • Event date

    May 18, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000387089800036