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Relationship of soldering profile, voids, formation and strength of soldered joints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F19%3A43955621" target="_blank" >RIV/49777513:23220/19:43955621 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/8810303" target="_blank" >https://ieeexplore.ieee.org/document/8810303</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2019.8810303" target="_blank" >10.1109/ISSE.2019.8810303</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Relationship of soldering profile, voids, formation and strength of soldered joints

  • Original language description

    This paper deals with relationship of soldering profile, void formation and mechanical strength of resulted solder joints. An experiment was design for this purpose. For the experiment, four solder paste (BiSnAg, SAC305, Sn100C, SnSb) and three surface finishes of PCB (ENIG, immersion Ag, immersion Sn) were used. Chip resistors 1206 were soldered by different soldering profile. The soldered joints were observed by X-ray and the void areas were calculated. The mechanical strength of the joints was measured after that. From the results, it is possible to find out the influence of surface finishes, soldering profiles or solder alloys on the formation of voids (area) and on the mechanical strength of joints.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/LO1607" target="_blank" >LO1607: RICE - New technologies and concepts for smart industrial system</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2019 42nd International Spring Seminar on Electronics Technology (ISSE 2019) : /proceedings/

  • ISBN

    978-1-7281-1874-1

  • ISSN

    2161-2528

  • e-ISSN

    2161-2536

  • Number of pages

    6

  • Pages from-to

    1-6

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Wroclaw, Poland

  • Event date

    May 15, 2019

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000507501000075