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Examination of Wet Assembling Methods in Printed Flexible Electronics

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F22%3A43965456" target="_blank" >RIV/49777513:23220/22:43965456 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/9812763" target="_blank" >https://ieeexplore.ieee.org/document/9812763</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE54558.2022.9812763" target="_blank" >10.1109/ISSE54558.2022.9812763</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Examination of Wet Assembling Methods in Printed Flexible Electronics

  • Original language description

    This paper examines two methods of assembling electronics SMD components on flexible substrates with low-temperature resistance. As a contact medium for interconnection between component and conductive pattern, conductive adhesive MG Chemicals 8331S-15G or conductive Ag printing paste DuPont PE 874 was used. The contact resistance of samples was measured after the assembling process and then mechanical tests were performed. Samples were subjected to a bend test and a rapid change of temperature in the shock chamber. Tests have shown that Ag paste can withstand high mechanical and temperature stress due to its stretchability and can partly return to its previous state after mechanical stress is released. On the other hand, conductive adhesive, which is rigid, tends to fail under high mechanical and temperature stress. Ag paste shows great assumptions to be used in the field of flexible or even stretchable electronics as a contact medium.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/EF18_069%2F0009855" target="_blank" >EF18_069/0009855: Electrical Engineering Technologies with High-Level of Embedded Intelligence</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2022 45th International Spring Seminar on Electronics Technology : /proceedings/

  • ISBN

    978-1-66546-589-2

  • ISSN

    2161-2536

  • e-ISSN

    2161-2536

  • Number of pages

    6

  • Pages from-to

    1-6

  • Publisher name

    IEEE

  • Place of publication

    Piscaway

  • Event location

    Vienna, Austria

  • Event date

    May 11, 2022

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000853642200013