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Assembly method and its influence on electrically conductive adhesives and solder pastes joints durability

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F15%3A00300022" target="_blank" >RIV/68407700:21230/15:00300022 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7248012&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F7229501%2F7247949%2F07248012.pdf%3Farnumber%3D7248012" target="_blank" >http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7248012&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F7229501%2F7247949%2F07248012.pdf%3Farnumber%3D7248012</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2015.7248012" target="_blank" >10.1109/ISSE.2015.7248012</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Assembly method and its influence on electrically conductive adhesives and solder pastes joints durability

  • Original language description

    This article is focused on comparing of different assembly methods, particularly stencil printing and dispensing paste deposition and compares lead and lead-free solder pastes with one-component and two-component epoxy based electrically conductive adhesives. The evaluation method is based on resistance measurement after accelerated stress tests. The aging was conducted using automatic mechanical cyclic stress machine tester and joint resistance to environment was tested using long term temperature straining and combined humidity and temperature straining. Shear strength measurement was done in order to determine mechanical stability of the connection.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    38th International Spring Seminar on Electronics Technology (ISSE 2015)

  • ISBN

    978-1-4799-8860-0

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    310-314

  • Publisher name

    Institute of Electrical and Electronics Engineers

  • Place of publication

    New York

  • Event location

    Eger

  • Event date

    May 6, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000374113000063