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Influence Of Thermal Aging On Intermetallic Compound Growth In Solder Alloys

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F22%3A43966049" target="_blank" >RIV/49777513:23220/22:43966049 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/9905224" target="_blank" >https://ieeexplore.ieee.org/document/9905224</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/Diagnostika55131.2022.9905224" target="_blank" >10.1109/Diagnostika55131.2022.9905224</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Influence Of Thermal Aging On Intermetallic Compound Growth In Solder Alloys

  • Original language description

    This article will present the influence of thermal aging and the reflow cycle numbers on intermetallic layer growth. Search for the new soldering alloy brings a new and different combination of elements, which behave differently in work conditions. The objects of the experiment are five types of solder alloys, the referential alloy is SAC compared to SnNi based solder alloys combined with germanium, cobalt, phosphor, and copper elements. The results of the experiment will be the thickness of intermetallic layers between the copper pad and solder alloys in different combinations of thermal aging and reflow cycles. Values will be supported by the elemental analysis by the electron microscope using an EDS (Energy-dispersive X-ray spectroscopy) analysis. More details about the solder alloys and settings reflow and aging processes will be presented in the paper.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/EF18_069%2F0009855" target="_blank" >EF18_069/0009855: Electrical Engineering Technologies with High-Level of Embedded Intelligence</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 2022 International Conference on Diagnostics in Electrical Engineering (Diagnostika) : CDEE 2022

  • ISBN

    978-1-66548-082-6

  • ISSN

  • e-ISSN

    2464-708X

  • Number of pages

    5

  • Pages from-to

  • Publisher name

    University of West Bohemia in Pilsen

  • Place of publication

    Pilsen

  • Event location

    Pilsen, Czech Republic

  • Event date

    Sep 6, 2022

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article