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Thermal Shock Ageing of Joints Soldered Using Formic Acid Vapors on Thick Printed Copper Substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F23%3A43968762" target="_blank" >RIV/49777513:23220/23:43968762 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/10168336" target="_blank" >https://ieeexplore.ieee.org/document/10168336</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE57496.2023.10168336" target="_blank" >10.1109/ISSE57496.2023.10168336</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Thermal Shock Ageing of Joints Soldered Using Formic Acid Vapors on Thick Printed Copper Substrates

  • Original language description

    This article addresses the soldering of larger components onto ceramic substrates with printed copper patterns with a reduced amount of flux. The main aim of the research was to find a suitable soldering method and study the reliability of soldered joints on ceramic substrates under thermal shock ageing. The mock-up chips were used in the test and for this reason the test was primarily focused on bottom joint in the structure or sandwich structures. In the experiment, vacuum soldering using formic acid vapors to reduce oxides was used. Then the samples were observed under X-RAY radiation and submitted for thermal shock testing (-40 °C / 125° C / 1000 cycles). After the shock testing, another X-RAY scan with void area measurement and shear strength testing were realized. The results showed that our contacting soldering process on ceramic substrates is applicable and the samples also endures the shock ageing, especially bottom joint between ceramic substrate with Cu layer and solder alloy. The results also showed that void area and mechanical shear strength of soldered ceramic samples are relatively comparable with standard samples (FR-4).

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2023

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the International Spring Seminar on Electronics Technology

  • ISBN

    979-8-3503-3484-5

  • ISSN

  • e-ISSN

    2161-2536

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Piscaway

  • Event location

    Timisoara, Romania

  • Event date

    May 10, 2023

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article