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SMD Components Recycling Procedure for Reuse in E-Textiles with Risk Analysis

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F24%3A43969179" target="_blank" >RIV/49777513:23220/24:43969179 - isvavai.cz</a>

  • Result on the web

    <a href="https://link.springer.com/chapter/10.1007/978-3-031-38165-2_114" target="_blank" >https://link.springer.com/chapter/10.1007/978-3-031-38165-2_114</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1007/978-3-031-38165-2_114" target="_blank" >10.1007/978-3-031-38165-2_114</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    SMD Components Recycling Procedure for Reuse in E-Textiles with Risk Analysis

  • Original language description

    This paper deals remanufacturing method for the reuse of adhesive bonded SMD components on stretchable textile ribbons for integration in e-textiles and its risk analysis. Nowadays, e-waste is an increasing problem in the world, and reducing this problem by using circular economy principles and reusing components is beneficial. In our research, the samples were submitted for accelerated ageing by dry heat and their quality was evaluated by the electrical resistance measurement. The recycling procedure was realized four times, and the mentioned risk analysis was realized before and after the experiment. The two main goals of our research were determined. The first goal was to demonstrate the applicability of our recycling procedure and the quality of samples with reused components after accelerated climatic ageing by dry heat. The second goal was to create and verify the risk analysis of our method and identify actions to mitigate the high and very high risks. The experiment showed that our recycling method is applicable several times without decreasing product quality. The results also present that reused samples are functional like new even after samples dry heat ageing. The risk analysis after the experiment showed seven high risks, which is necessary to solve primarily. These risk factors and actions to mitigate them are described in the paper.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of FAIM 2023

  • ISBN

    978-3-031-38164-5

  • ISSN

    2195-4356

  • e-ISSN

    2195-4364

  • Number of pages

    11

  • Pages from-to

    988-998

  • Publisher name

    Springer Cham

  • Place of publication

    Cham

  • Event location

    Porto, Portugal

  • Event date

    Jun 18, 2023

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article