Analysis of total hemispherical emissivity of samples from sample groups 01-03

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F13%3A43921560" target="_blank" >RIV/49777513:23640/13:43921560 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Analysis of total hemispherical emissivity of samples from sample groups 01-03

Original language description

In the present work there is described measurement of total hemispherical emissivity of samples from Frentech Aerospace s.r.o. done by spectral reflectivity measurement. The samples were thin films coated substrates with different roughness and geometry.The measurement was done by two variations of the method: (i) specular directional reflectivity measurement and (ii) diffuse normal-hemispherical reflectivity measurement. All the measured values of total hemispherical emissivity using the diffuse reflectivity method are in the range epsilon+deltaepsilon{0.025.

Czech name

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Czech description

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Type

V_souhrn - Summary research report

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

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Continuities

N - Vyzkumna aktivita podporovana z neverejnych zdroju

Publication year

2013

Confidentiality

C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

Number of pages

19

Place of publication

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Publisher/client name

Frentech Aerospace s.r.o.

Version

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