Emissivity measurement method for low emissivity samples

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F13%3A43921561" target="_blank" >RIV/49777513:23640/13:43921561 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Emissivity measurement method for low emissivity samples

Original language description

In the present work there is described a new method of measurement of total hemispherical emissivity by spectral reflectivity measurement. This method enables measurement of low emissivity samples with high precision. The used equipment, measurement andcalculation procedures and measurement uncertainty are described. There are two variations of the method: (i) specular directional reflectivity measurement and (ii) diffuse normal-hemispherical reflectivity measurement. The measurement uncertainties (coverage factor k=1) of the emissivity measurement methods are: (i) deltaepsilon=0.009 and (ii) deltaepsilon=0.019 (rough samples), deltaepsilon=0.006 (almost specular samples).

Czech name

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Czech description

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Type

V_souhrn - Summary research report

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

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Continuities

N - Vyzkumna aktivita podporovana z neverejnych zdroju

Publication year

2013

Confidentiality

C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

Number of pages

16

Place of publication

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Publisher/client name

Frentech Aerospace s.r.o.

Version

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