Thickness dependence of structural, electrical and optical behaviour of undoped ZnO thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60076658%3A12640%2F08%3A00009962" target="_blank" >RIV/60076658:12640/08:00009962 - isvavai.cz</a>
Alternative codes found
RIV/67179843:_____/08:00343298
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Thickness dependence of structural, electrical and optical behaviour of undoped ZnO thin films
Original language description
Undoped ZnO thin films of different thicknesses were prepared by r.f. sputtering in order to study the thickness effect upon their structural, morphological, electrical and optical properties. The results suggest that the film thickness seems to have noclear effect upon the orientation of the grains growth. Indeed, the analysis with X-ray diffraction show that the grains were always oriented according to the c(0 0 2)-axis perpendicular to substrate surface whatever the thickness is. However, the grainsize was influenced enough by this parameter. An increase in the grain size versus the thickness was noted. For the electrical properties, measurements revealed behaviour very dependent upon thickness. The resistivity decreased from 25 to 1.5 x 10(-3) Omega cm and the mobility increased from 2 to 37cm(2) V-1 s(-1) when the thickness increased from 70 to 1800 nm while the carrier concentration seems to be less affected by the film thickness and varied slightly remaining around 1020 cm(-3)
Czech name
Míra závislosti strukturálního, elektrického a optického chování ?undoped? ZnO tenkých filmů
Czech description
?Undoped? ZnO tenké filmy různé tloušťky byly připraveny pokovováním pro studium efektu tloušťky na jejich strukturální, morfologické, elektrické a optické vlastnosti. Výsledky naznačují, že tloušťka filmu nemá žádný jasný efekt na orientaci růstu krystalů. Vskutku, anylýzy X-ray difrakce ukazují, že krystaly byly vždy orientovány podle kolmé osy c(0 0 2) k povrchu substrátu při jakékoliv tloušťce. Nicméně velikost krystalů byla tímto parametrem ovlivněna dostatečně.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BO - Biophysics
OECD FORD branch
—
Result continuities
Project
—
Continuities
V - Vyzkumna aktivita podporovana z jinych verejnych zdroju
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica B - Condensed Matter
ISSN
0921-4526
e-ISSN
—
Volume of the periodical
403
Issue of the periodical within the volume
18
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
5
Pages from-to
—
UT code for WoS article
000259626500066
EID of the result in the Scopus database
—