Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60077344%3A_____%2F13%3A00421779" target="_blank" >RIV/60077344:_____/13:00421779 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/13:00421779 RIV/00216305:26210/13:PU104934

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM

Original language description

Yeasts like Candida parapsilosis as well as Candida albicans has been recently recognized as an important cause of serious biofilm infections associated with implanted medical devices. The multi-layered biofilms formed by these microorganisms were observed by cryo-scanning electron microscope (cryo-SEM) with using freeze-fracturing technique and by focused ion beam scanning electron microscopy (FIB-SEM). Both imaging methods are compared.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

19

Issue of the periodical within the volume

S2

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

226-227

UT code for WoS article

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EID of the result in the Scopus database

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