Monitoring of Multilayered Bacterial Biofilm Morphology by Cryo-SEM for Raman Spectroscopy Measurements

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60077344%3A_____%2F15%3A00450101" target="_blank" >RIV/60077344:_____/15:00450101 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/15:00450101 RIV/00216305:26210/15:PU115129

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Monitoring of Multilayered Bacterial Biofilm Morphology by Cryo-SEM for Raman Spectroscopy Measurements

Original language description

Staphylococcus epidermidis has been recently recognized as an important cause of serious biofilm infections associated with implanted medical devices. In presented work the multi-layered biofilms formed by these microorganisms were observed by scanning electron microscope (SEM), in particular with using freeze-fracturing technique. The freeze-fracture technique consists of physically breaking apart (fracturing) a rapidly frozen biological sample; structural detail exposed by the fracture plane is then visualized by metal deposition. An optional step, involving vacuum sublimation of ice, may be carried out after fracturing. Freeze fracture is unique among electron microscopic techniques in providing planar views of the internal organization of membranesor biofilms. Deep etching of ultra-rapidly frozen samples permits visualization of the surface structure of cells and their components. Our sample was fractured after rapid-freezing into liquid nitrogen, the air-water was removed by shor

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2015

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

21

Issue of the periodical within the volume

S3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

187-188

UT code for WoS article

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EID of the result in the Scopus database

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