Diffuse Reflectance of Thin Films with Defects

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F23%3A00558530" target="_blank" >RIV/60162694:G43__/23:00558530 - isvavai.cz</a>
Result on the web
<a href="https://journals.lka.lt/journal/cndcgs" target="_blank" >https://journals.lka.lt/journal/cndcgs</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.47459/cndcgs.2022.31" target="_blank" >10.47459/cndcgs.2022.31</a>

Result language
angličtina
Original language name
Diffuse Reflectance of Thin Films with Defects
Original language description
This paper presents the method of the optical analysis of thin films with defects. The attention is devoted to the defects consisting in boundary roughness. This method is based on interpreting the spectral dependences of the diffuse reflectance of light. The numerical analysis confirms the fundamental influence of the parameters of the defects of thin films on the diffuse reflectance.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
CHALLENGES TO NATIONAL DEFENCE IN CONTEMPORARY GEOPOLITICAL SITUATION (CNDCGS`2022)
ISBN
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ISSN
2669-2023
e-ISSN
2538-8959
Number of pages
5
Pages from-to
243-247
Publisher name
General Jonas Zemaitis Military Academy of Lithuania
Place of publication
Vilnius
Event location
Vilnius, Litevská republika
Event date
Sep 15, 2022
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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