Ag implantation into silicate glasses for optical applications
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F08%3A00020546" target="_blank" >RIV/60461373:22310/08:00020546 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Ag implantation into silicate glasses for optical applications
Original language description
Materials containing metal particles and clusters could be interesting for photonics applications. Recently, the ion implantation technique has been applied for doping of metal particles into glass substrates to change its linear and nonlinear propertiesin layers near the surface. In this work we present a systematic study of the Ag ion implantation into different types of silicate glasses ? both commercial and specially designed. The glasses differed in concentration and types of network elements (Si,Al and/or B) as well as monovalent (Na, K, Li) and divalent modificators (CaO, MgO and/or ZnO). The energy of the implanted Ag ions was 330 keV and used implantation fluency of ions was kept at 1.1016 ions.cm-2. The as-implanted samples were annealed inair at 600 °C for 5 hours. Diffusion profiles of the implanted Ag ions were measured by the Rutherford Backscattering Spectrometry. The UV-VIS spectra were measured to examine the desired absorption around 400 nm. The type and amount of
Czech name
Ag implantation into silicate glasses for optical applications
Czech description
Materials containing metal particles and clusters could be interesting for photonics applications. Recently, the ion implantation technique has been applied for doping of metal particles into glass substrates to change its linear and nonlinear propertiesin layers near the surface. In this work we present a systematic study of the Ag ion implantation into different types of silicate glasses ? both commercial and specially designed. The glasses differed in concentration and types of network elements (Si,Al and/or B) as well as monovalent (Na, K, Li) and divalent modificators (CaO, MgO and/or ZnO). The energy of the implanted Ag ions was 330 keV and used implantation fluency of ions was kept at 1.1016 ions.cm-2. The as-implanted samples were annealed inair at 600 °C for 5 hours. Diffusion profiles of the implanted Ag ions were measured by the Rutherford Backscattering Spectrometry. The UV-VIS spectra were measured to examine the desired absorption around 400 nm. The type and amount of
Classification
Type
D - Article in proceedings
CEP classification
JJ - Other materials
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LC06041" target="_blank" >LC06041: Preparation, modification and characterization of materials by energetic radiation.</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
The 8th Conference on Solid State Chemistry, ,
ISBN
978-80-224-1019-9
ISSN
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e-ISSN
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Number of pages
1
Pages from-to
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Publisher name
Bratislava, Slovakia
Place of publication
Bratislava, Slovakia
Event location
Bratislava, Slovakia
Event date
Jul 6, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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