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Probing the local dielectric function of WS2 on an Au substrate by near field optical microscopy operating in the visible spectral range

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F22%3A00547356" target="_blank" >RIV/61388955:_____/22:00547356 - isvavai.cz</a>

  • Result on the web

    <a href="http://hdl.handle.net/11104/0323598" target="_blank" >http://hdl.handle.net/11104/0323598</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.apsusc.2021.151672" target="_blank" >10.1016/j.apsusc.2021.151672</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Probing the local dielectric function of WS2 on an Au substrate by near field optical microscopy operating in the visible spectral range

  • Original language description

    The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is affected by excitonic resonances, charge transfer effects, doping, sample stress and strain, and surface roughness. Knowledge of the dielectric function grants access to a material's transmissive and absorptive characteristics. Here we use the dual scanning near field optical microscope (dual s-SNOM) for imaging local dielectric variations and extracting dielectric function values using a pre-established mathematical inversion method. To demonstrate our approach, we studied a monolayer of WS2 on bulk Au and identified two areas with differing levels of charge transfer. The experiments highlight a further advantage of the technique: the dielectric function of contaminated samples can be measured, as dirty areas can be easily identified and excluded for the calculation, being important especially for exfoliated 2D materials (Rodriguez et al., 2021). Our measurements are corroborated by atomic force microscopy (AFM), Kelvin force probe microscopy (KPFM), photoluminescence (PL) intensity mapping, and tip enhanced photoluminescence (TEPL). We extracted local dielectric variations from s-SNOM images and confirmed the reliability of the obtained values with spectroscopic imaging ellipsometry (SIE) measurements.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10403 - Physical chemistry

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Surface Science

  • ISSN

    0169-4332

  • e-ISSN

    1873-5584

  • Volume of the periodical

    574

  • Issue of the periodical within the volume

    FEB 2022

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    8

  • Pages from-to

    151672

  • UT code for WoS article

    000727808400001

  • EID of the result in the Scopus database

    2-s2.0-85117701028