Probing the local dielectric function of WS2 on an Au substrate by near field optical microscopy operating in the visible spectral range
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F22%3A00547356" target="_blank" >RIV/61388955:_____/22:00547356 - isvavai.cz</a>
Result on the web
<a href="http://hdl.handle.net/11104/0323598" target="_blank" >http://hdl.handle.net/11104/0323598</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2021.151672" target="_blank" >10.1016/j.apsusc.2021.151672</a>
Alternative languages
Result language
angličtina
Original language name
Probing the local dielectric function of WS2 on an Au substrate by near field optical microscopy operating in the visible spectral range
Original language description
The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is affected by excitonic resonances, charge transfer effects, doping, sample stress and strain, and surface roughness. Knowledge of the dielectric function grants access to a material's transmissive and absorptive characteristics. Here we use the dual scanning near field optical microscope (dual s-SNOM) for imaging local dielectric variations and extracting dielectric function values using a pre-established mathematical inversion method. To demonstrate our approach, we studied a monolayer of WS2 on bulk Au and identified two areas with differing levels of charge transfer. The experiments highlight a further advantage of the technique: the dielectric function of contaminated samples can be measured, as dirty areas can be easily identified and excluded for the calculation, being important especially for exfoliated 2D materials (Rodriguez et al., 2021). Our measurements are corroborated by atomic force microscopy (AFM), Kelvin force probe microscopy (KPFM), photoluminescence (PL) intensity mapping, and tip enhanced photoluminescence (TEPL). We extracted local dielectric variations from s-SNOM images and confirmed the reliability of the obtained values with spectroscopic imaging ellipsometry (SIE) measurements.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10403 - Physical chemistry
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
1873-5584
Volume of the periodical
574
Issue of the periodical within the volume
FEB 2022
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
8
Pages from-to
151672
UT code for WoS article
000727808400001
EID of the result in the Scopus database
2-s2.0-85117701028