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Local characterization of optical waveguide structure using Scanning near-field optical microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU43648" target="_blank" >RIV/00216305:26220/04:PU43648 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Local characterization of optical waveguide structure using Scanning near-field optical microscopy

  • Original language description

    Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developeda technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of

  • Czech name

    Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli

  • Czech description

    Rastrovací optická mikroskopie v blízkém poli(SNOM) je možné použít k měření vnitřního rozložení vidů a lokálních vlastností vlnovodu. Malé fluktuace charakteristik materiálu mohou ovlivnit vlastní měření. Lokální sondové měření umožní vyhnout se tomutoproblému a experimentálně ověřit perturbace zavedené při měření pomocí sondy SNOM.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Applied physics on condensed matter APCOM ? 2004

  • ISBN

    80-227-2073-9

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    183-186

  • Publisher name

    Slovak Technical University in Bratislava

  • Place of publication

    Bratislava

  • Event location

    Častá-Píla

  • Event date

    Jun 16, 2004

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article