Local characterization of optical waveguide structure using Scanning near-field optical microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU43648" target="_blank" >RIV/00216305:26220/04:PU43648 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Local characterization of optical waveguide structure using Scanning near-field optical microscopy
Original language description
Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developeda technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of
Czech name
Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli
Czech description
Rastrovací optická mikroskopie v blízkém poli(SNOM) je možné použít k měření vnitřního rozložení vidů a lokálních vlastností vlnovodu. Malé fluktuace charakteristik materiálu mohou ovlivnit vlastní měření. Lokální sondové měření umožní vyhnout se tomutoproblému a experimentálně ověřit perturbace zavedené při měření pomocí sondy SNOM.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Applied physics on condensed matter APCOM ? 2004
ISBN
80-227-2073-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
183-186
Publisher name
Slovak Technical University in Bratislava
Place of publication
Bratislava
Event location
Častá-Píla
Event date
Jun 16, 2004
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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