Thickness dependence of nanofilm elastic modulus

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388998%3A_____%2F09%3A00323549" target="_blank" >RIV/61388998:_____/09:00323549 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Thickness dependence of nanofilm elastic modulus

Original language description

Young?s modulus is a fundamental physical parameter that determines both the mechanic and electronic properties of a solid thin film. In here, we show that the elastic modulus is not a constant as that of conventional treatment but varies with film thickness. It has been shown that there exists some film thickness hb when the surface energy comes into play. The hb is inverse proportional to the bulk Young?s modulus and depends strongly on the in-plain strain. For Si nanofilms, the dimensionless elasticmodulus E/Ebulk can be presented as a power function of the dimensionless film thickness h/hb.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Physics Letters

ISSN

0003-6951

e-ISSN

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Volume of the periodical

94

Issue of the periodical within the volume

15

Country of publishing house

US - UNITED STATES

Number of pages

3

Pages from-to

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UT code for WoS article

000265285200045

EID of the result in the Scopus database

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