Wrinkled SiGe nanofilms as a source of terahertz radiation

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388998%3A_____%2F14%3A00434615" target="_blank" >RIV/61388998:_____/14:00434615 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/ISOT.2014.37" target="_blank" >http://dx.doi.org/10.1109/ISOT.2014.37</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISOT.2014.37" target="_blank" >10.1109/ISOT.2014.37</a>

Result language
angličtina
Original language name
Wrinkled SiGe nanofilms as a source of terahertz radiation
Original language description
We demonstrate that the wrinkled Si1?xGex/Si1?y Gey films can serve as radiation sources, which emit electromagnetic waves in a very wide range of the frequencies including the terahertz band from 0.3 to 3 THz. The emission mechanism is based on the change of acceleration of carriers, when they travel along the sinusoidal trajectory in wrinkled Si1? xGex/Si1?yGey films, a manner similar to synchrotron radiation with undulators, or like a free-electron laser.
Czech name
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Czech description
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Project
<a href="/en/project/LH12042" target="_blank" >LH12042: Optical viscometer utilizing the bend loss of the vibrating fiber</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
ISOT 2014 : International symposium on optomechatronic technologies
ISBN
978-1-4799-6666-0
ISSN
1063-6900
e-ISSN
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Number of pages
4
Pages from-to
121-124
Publisher name
I E E E Computer Society
Place of publication
Danvers
Event location
Seattle, Washington
Event date
Nov 5, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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