On the Potential Application of the Wrinkled SiGe/SiGe Nanofilms

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388998%3A_____%2F16%3A00458793" target="_blank" >RIV/61388998:_____/16:00458793 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.4236/wjm.2016.62003" target="_blank" >http://dx.doi.org/10.4236/wjm.2016.62003</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.4236/wjm.2016.62003" target="_blank" >10.4236/wjm.2016.62003</a>

Result language
angličtina
Original language name
On the Potential Application of the Wrinkled SiGe/SiGe Nanofilms
Original language description
Terahertz radiation (THzR) consists of electromagnetic waves within the band of frequencies from 0.3 to 3 terahertz with the wavelengths of radiation in the range from 0.1 mm to 1 mm, respe c- tively. The technology for generating and manipulating THzR is still in its initial stage. Herein, we demonstrate that the wrinkled Si 1 – x Ge x /Si 1 – y Ge y films can be used as radiation sources, which emit electromagnetic waves (EMW) in a very wide range of the frequencies including the terahertz band from 0.3 to 3 THz and far IR from 3 THz to 20 THz. These findings provide the theoretical foundation for the wrinkled nanofilm radiation emission and may allow, to some extent, to fill the terahertz gap.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BE - Theoretical physics
OECD FORD branch
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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