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MDFT program: calculation of 2D and 1D diffraction patterns from electron micrographs

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F05%3A00020811" target="_blank" >RIV/61389013:_____/05:00020811 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    MDFT program: calculation of 2D and 1D diffraction patterns from electron micrographs

  • Original language description

    MDFT program, described in this work, calculates discrete Fourier transform of grayscale electron micrographs, yielding results in the form of 2D-image or 1D-graphs. Scanning electron micrographs (SEM), which showed crystalline and amorphous regions in UHMWPE polymer were processed by MDFT and long period (LP) was calculated. The values of LP from MDFT were comparable with those obtained from small-angle X-ray scattering (SAXS).

  • Czech name

    Program MDFT: výpočet 2D a 1D difrakčních obrazů ze SM mikrofotografií

  • Czech description

    Program MDFT, popsaný v této práci, počítá diskrétní Fourierovu transfomaci obrázku z rastrovacího elektronového mikroskopu (SEM). Výsledky dává ve formě 2D-obrázku nebo 1D-grafu. Na příkladu SEM mikrofotografií zobrazujících krystalické a amorfní oblasti v polymeru UHMWPE bylo demonstrováno, že 1D-grafy vypočtené programem MDFT poskytují hodnoty dlouhé periody, které jsou srovnatelné s hodnotami ziskanými pomocí maloúhlového rozptylu paprsku X (SAXS).

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CF - Physical chemistry and theoretical chemistry

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA106%2F04%2F1118" target="_blank" >GA106/04/1118: Monitoring and minimization of wear ultrahigh molecular weight polyethylene (UHMWPE) used for joint replacements</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Materials Structure in Chemistry, Biology, Physics and Technology

  • ISSN

    1211-5894

  • e-ISSN

  • Volume of the periodical

    12

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    5

  • Pages from-to

    85-89

  • UT code for WoS article

  • EID of the result in the Scopus database