Real-Time Analysis of Semiconductor Memories under the Influence of Ionizing Radiation
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F18%3A10241583" target="_blank" >RIV/61989100:27240/18:10241583 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/8323990" target="_blank" >https://ieeexplore.ieee.org/document/8323990</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/SAMI.2018.8323990" target="_blank" >10.1109/SAMI.2018.8323990</a>
Alternative languages
Result language
angličtina
Original language name
Real-Time Analysis of Semiconductor Memories under the Influence of Ionizing Radiation
Original language description
This paper aims to analyze the influence of ionizing irradiation on various types of the semiconductor memories by means of the FPGA circuit logic. The reason for such tests is to determine the durability of digital electronics in the biomedicine, e. g. in pacemakers, during the radiotherapy. Static RAM EPROM and EEPROM memories were tested, which were tested, which were placed on a gamma-exposed test pad. As a source of the ionizing radiation, the TERAGAM irradiator and The Cyber Knife radio surgical instrument with a linear accelerator were used. The Memory Testing Controller is built on the FPGA chip that tests all the connected memories in parallel, and stores the detailed results in the event log.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
SAMI 2018 - IEEE 16th World Symposium on Applied Machine Intelligence and Informatics Dedicated to the Memory of Pioneer of Robotics Antal (Tony) K. Bejczy, Proceedings
ISBN
978-1-5386-4772-1
ISSN
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e-ISSN
neuvedeno
Number of pages
4
Pages from-to
81-84
Publisher name
IEEE
Place of publication
Vienna
Event location
Kosice
Event date
Feb 7, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000458546000017