Application Dependent FPGA Testing Method
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F10%3A%230002874" target="_blank" >RIV/46747885:24220/10:#0002874 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5615554" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5615554</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DSD.2010.65" target="_blank" >10.1109/DSD.2010.65</a>
Alternative languages
Result language
angličtina
Original language name
Application Dependent FPGA Testing Method
Original language description
Application dependent FPGA testing can reduce time and memory requirements comparing with the tests that exercise complete FPGA structure. This paper describes a methodology of FPGA testing that does not require reconfiguration of the tested hardware andthus it preserves conditions that caused erroneous behavior of the FPGA during its function.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: SoC circuits reliability and availability improvement</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD), 2010
ISBN
978-1-4244-7839-2
ISSN
—
e-ISSN
—
Number of pages
6
Pages from-to
525-530
Publisher name
IEEE
Place of publication
Lille; France
Event location
Lille; France
Event date
Jan 1, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—