White-light interferometry on rough surfaces - measurement uncertainty caused by noise

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F12%3A33139154" target="_blank" >RIV/61989592:15310/12:33139154 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1364/AO.51.000465" target="_blank" >http://dx.doi.org/10.1364/AO.51.000465</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/AO.51.000465" target="_blank" >10.1364/AO.51.000465</a>

Result language
angličtina
Original language name
White-light interferometry on rough surfaces - measurement uncertainty caused by noise
Original language description
White-light interferometry on rough surfaces is an optical method for the measurement of the geometrical form of objects. The longitudinal coordinate of the measured surface is obtained from the measured interferogram by means of an evaluation method. However, the longitudinal coordinate cannot be determined completely accurately because the interferogram is affected by noise. We calculate the lower limit of the longitudinal measurement uncertainty caused by noise by use of the Cramer-Rao inequality. Additionally, we calculate the lower limit of the longitudinal measurement uncertainty caused by shot noise only.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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