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Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F20%3A00538153" target="_blank" >RIV/67985882:_____/20:00538153 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1016/j.vacuum.2020.109199" target="_blank" >https://doi.org/10.1016/j.vacuum.2020.109199</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.vacuum.2020.109199" target="_blank" >10.1016/j.vacuum.2020.109199</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering

  • Original language description

    ZnO thin films were deposited by RF-magnetron sputtering of ZnO powder target using pure argon and argon with methane as reactive gas. It is found that growth morphology and electronic properties of the films are strongly affected by adding of methane to argon during the deposition process. Adding of methane resulted in a high energy shift of near band edge ultraviolet photoluminescence band and quenching of deep level emission in the visible spectral range. The strongest effect of methane has been found for electrical resistivity that reduced by 3 orders of magnitude in comparison with films deposited in pure argon. Unexpectedly, the analysis of the chemical composition showed no carbon incorporated from methane. Therefore, modification effects were assigned to hydrogen incorporation. However, the direct comparison of resistivity of the films deposited using methane and molecular hydrogen as doping precursors has demonstrated that doping efficiency of the methane is about an order of magnitude larger than that of molecular hydrogen under similar deposition conditions. This advantage of the methane is discussed and assigned to specific surface chemistry of Zn-O-C-H system that enhances the formation of shallow donor defects during plasma assisted deposition process

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10304 - Nuclear physics

Result continuities

  • Project

    <a href="/en/project/GA19-02804S" target="_blank" >GA19-02804S: Nanostructured heterojunctions for chemiresistors</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Vacuum

  • ISSN

    0042-207X

  • e-ISSN

  • Volume of the periodical

    174

  • Issue of the periodical within the volume

    April

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    6

  • Pages from-to

    109199

  • UT code for WoS article

    000517661000022

  • EID of the result in the Scopus database

    2-s2.0-85078002307