Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F20%3A00538153" target="_blank" >RIV/67985882:_____/20:00538153 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1016/j.vacuum.2020.109199" target="_blank" >https://doi.org/10.1016/j.vacuum.2020.109199</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.vacuum.2020.109199" target="_blank" >10.1016/j.vacuum.2020.109199</a>
Alternative languages
Result language
angličtina
Original language name
Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering
Original language description
ZnO thin films were deposited by RF-magnetron sputtering of ZnO powder target using pure argon and argon with methane as reactive gas. It is found that growth morphology and electronic properties of the films are strongly affected by adding of methane to argon during the deposition process. Adding of methane resulted in a high energy shift of near band edge ultraviolet photoluminescence band and quenching of deep level emission in the visible spectral range. The strongest effect of methane has been found for electrical resistivity that reduced by 3 orders of magnitude in comparison with films deposited in pure argon. Unexpectedly, the analysis of the chemical composition showed no carbon incorporated from methane. Therefore, modification effects were assigned to hydrogen incorporation. However, the direct comparison of resistivity of the films deposited using methane and molecular hydrogen as doping precursors has demonstrated that doping efficiency of the methane is about an order of magnitude larger than that of molecular hydrogen under similar deposition conditions. This advantage of the methane is discussed and assigned to specific surface chemistry of Zn-O-C-H system that enhances the formation of shallow donor defects during plasma assisted deposition process
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10304 - Nuclear physics
Result continuities
Project
<a href="/en/project/GA19-02804S" target="_blank" >GA19-02804S: Nanostructured heterojunctions for chemiresistors</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Vacuum
ISSN
0042-207X
e-ISSN
—
Volume of the periodical
174
Issue of the periodical within the volume
April
Country of publishing house
GB - UNITED KINGDOM
Number of pages
6
Pages from-to
109199
UT code for WoS article
000517661000022
EID of the result in the Scopus database
2-s2.0-85078002307